#43 | Impact Analysis of KPI Scenarios, Automated Best Practices Identification, and Deviations on Manufacturing Processes
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PPS 2 – Big Data and Predictive Analytics for i4.0
2022 “Impact Analysis of KPI Scenarios, Automated Best Practices Identification, and Deviations on Manufacturing Processes”
Authors: M.J. Lopes, E.M. Rocha.
Conference: ETFA 2022 - 27th Annual Conference of the IEEE Industrial Electronics Society (IES), September 6-9, Stuttgart, Germany.